Characterization of Semiconductors Component
Description
The Linseis HCS systems are mainly used to characterize semiconductor materials. They can determine both the Hall constant and the specific resistance, as well as the charge carrier concentration and Hall mobilities of the samples derived from these. The desktop base unit is available in different configurations, which can be equipped with different sample holders for different sample geometries and temperature requirements. An optional low-temperature extension for the use of liquid nitrogen and a high-temperature version up to 800°C guarantee that all conceivable areas of application can be covered.
The built-in permanent and electromagnets provide fixed or variable magnetic fields of up to almost one Tesla.The associated, comprehensive and Windows©-based software enables the uncomplicated recording of I-V and I-R curves as well as the measurement and evaluation of Hall mobility, electrical conductivity and charge carrier concentration. The Linseis HCS systems can measure a wide variety of materials, including Si, SiGe, SiC, GaAs, InGaAs, InP, GaN (N type & P type) as well as metal layers, metal oxides and many more.
Measuring functions:
- Charge carrier density (layer [1/cm²]/solid material [1/cm³])
- Hall constant [cm³/C]
- Hall mobility [cm²/Vs]
- Sheet resistance [Ω]
- Specific resistance [Ωcm]
- Electrical conductivity[S/cm]
- Alpha (ratio of horizontal to vertical resistance)
- Magnetoresistance
- Seebeck coefficient (µV/K)
Device features:
- Gas-tight measuring chamber, which enables measurements under defined atmospheres or vacuum conditions
- Magnets with 120 mm diameter for highest field homogeneity and maximum accuracy (poles up to 50mm x 50mm are possible)
- Modular and upgradeable system design
- High-temperature version up to 600°C/873K
- LED lighting option (several wavelengths are possible)
- Optional lock-in amplifier for measurements with minimal noise
- Connection for the use of external measuring electronics
- Integrated software package for user-friendly operability
